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HK LEE HING INDUSTRY CO., LIMITED
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IEC Standard Articulated Test Probe with 10N Thrust, IEC 61032

IEC Standard Articulated Test Probe with 10N Thrust, IEC 61032
  • IEC Standard Articulated Test Probe with 10N Thrust, IEC 61032
  • IEC Standard Articulated Test Probe with 10N Thrust, IEC 61032
Products Detailed
IEC Standard Articulated Test Probe is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to ...
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